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FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea
Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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Field emission gun scanning electron microscope
Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, ph
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High-speed atomic force microscope
A custom-built contact-mode high-speed atomic force microscope (HS-AFM) for imaging nanoscale structures with millisecond time resolution and over macroscale areas.
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Mettler Toledo TGA/DSC1 Star System
TGA/DSC; Thermogravimetric analysis / Differential scanning calorimetry
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Quantachrome NOVA 1200
BET surface area and porosity analysis
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Various Dynamic Holographic Assembler with Cyberforce Haptic system
DHA, Optical tweezers
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Various IAC magnetic sector SIMS/ion milling instrument
Magnetic Sector SIMS
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Various IAC/Oxford; DC magnetron sputter chamber
Synthesis of epitaxial thin films
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